Date of Award
12-1992
Document Type
Thesis
Degree Name
Master of Science
Department
Department of Engineering Physics
First Advisor
Peter Haaland, PhD
Abstract
The production of cations by electron impact on tetraethoxysilane (TEOS) is studied with a Fourier Transform mass spectrometer (FTMS). The operating principles of FTMS are reviewed and the experimental approach to the mass calibration and cross-section measurement is discussed. The cross-sections for total and partial ionization of Si(OC2H5)4 from threshold to 50 eV are measured. Also, the ion chemistry resulting from interactions between ions and neutral TEOS is examined.
AFIT Designator
AFIT-GEP-ENP-92D-06
DTIC Accession Number
ADA258830
Recommended Citation
Holtgrave, Jeremy C., "Cation Production and Reactions Induced by Electron Impact on Tetraethoxysilane" (1992). Theses and Dissertations. 7186.
https://scholar.afit.edu/etd/7186
Comments
The author's Vita page is omitted.