Date of Award
3-1997
Document Type
Thesis
Degree Name
Master of Science
Department
Department of Operational Sciences
First Advisor
Edward F. Mykytka, PhD
Abstract
This research effort focuses on applying statistical process control (SPC) techniques to the departure reliability improvement process for Air Mobility Command, Mission Reliability Office. Basic SPC methods, including Pareto analysis, cause and effect diagrams, and control charts are determined to be effective tools for analyzing and assessing departure reliability. In addition, two more alternative measures of effectiveness for departure reliability are evaluated and compared using AMC's data. SPC methods are also shown to be useful in assessing in performance and in determining the reporting frequency for on-time performance information. Additional statistical analyses are conducted, including on-way analyses of variance, hypothesis tests, autocorrelation of time series and normal probability plots.
AFIT Designator
AFIT-GOR-ENS-97M-14
DTIC Accession Number
ADA324184
Recommended Citation
Chieh, Liu W., "The Application of Statistical Process Control to Departure Reliability Improvement" (1997). Theses and Dissertations. 5977.
https://scholar.afit.edu/etd/5977