Date of Award
Master of Science
Department of Engineering Physics
Larry W. Burggraf, PhD
Tri-layer thermal diffusion modeling was applied to the optimization of a multi-layer reed sensor for use in a photothermal infrared detector. The multi-layer reed sensor deflects in response to increased temperature. Deflection, of angstroms or larger, is measured using an atomic force microscope. A newly developed thermal diffusion model for three layer reeds was combined with an existing two-layer cantilever model, in order to explore the effects of length, operating frequency, and layer thickness on signal to noise ratio. Model behavior is presented, and compared to laboratory results.
DTIC Accession Number
Wiggins, Janine O.J., "Optimization of a Multilayer Photothermal Sensor for Infrared Spectroscopy" (1999). Theses and Dissertations. 5184.
The author's Vita page is omitted.