Date of Award

3-1999

Document Type

Thesis

Degree Name

Master of Science

Department

Department of Engineering Physics

First Advisor

Larry W. Burggraf, PhD

Abstract

Tri-layer thermal diffusion modeling was applied to the optimization of a multi-layer reed sensor for use in a photothermal infrared detector. The multi-layer reed sensor deflects in response to increased temperature. Deflection, of angstroms or larger, is measured using an atomic force microscope. A newly developed thermal diffusion model for three layer reeds was combined with an existing two-layer cantilever model, in order to explore the effects of length, operating frequency, and layer thickness on signal to noise ratio. Model behavior is presented, and compared to laboratory results.

AFIT Designator

AFIT-GAP-ENP-99M-16

DTIC Accession Number

ADA361427

Comments

The author's Vita page is omitted.

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