Date of Award
6-2004
Document Type
Thesis
Degree Name
Master of Science in Electrical Engineering
Department
Department of Electrical and Computer Engineering
First Advisor
William D. Wood, PhD
Second Advisor
Todd B. Hale, PhD
Abstract
The increased need for stealth aircraft requires an on-site Far-Field (FF) Radar Cross-Section (RCS) measurement process. Conducting these measurements in on-site Near-Field (NF) monostatic facilities results in significant savings for manufacturers and acquisition programs. However, NF measurements are not directly extended to a FF RCS. Therefore, a large target Near-Field to Far-Field Transformation (NFFFT) is needed for RCS measurements. One approach requires an Inverse Synthetic Aperture Radar (ISAR) process to create accurate scattering maps. The focus of this work is the development of accurate NF scattering maps generated by a monostatic ISAR process. As a first look, the process is isolated to a simulated environment to avoid the uncontrollable effects of real measurement environments. The simulation begins with a NF Synthetic Target Generator (STG) which approximates a target using scattering centers illuminated by spherical electromagnetic waves to approximating NF scattering. The resulting NF In-phase and Quadrature (IQ) data is used in a "Trapezoidal" ISAR process to create spatially distorted images that are accurately corrected within the ISAR process resolution using a newly developed NF correction. The resulting spatially accurate ISAR images do not complete the NFFFT. However, accurate scattering maps are essential for process development.
AFIT Designator
AFIT-GE-ENG-04-24
DTIC Accession Number
ADA426468
Recommended Citation
Watkins, John R., "Utilizing Near-Field Measurements to Characterize Far-Field Radar Signatures" (2004). Theses and Dissertations. 4053.
https://scholar.afit.edu/etd/4053