Date of Award

6-6-2006

Document Type

Thesis

Degree Name

Master of Science

Department

Department of Engineering Physics

First Advisor

Michael A. Marciniak, PhD

Abstract

Infrared absorption and photoluminescence measurements have been used to optically characterize bulk-grown, 680-μm thick, indium antimonide (InSb), both as-grown and after passivation by either anodization or a 700-Å layer of silicon oxide (SiOx). Spectra were obtained using Fourier transform infrared (FT-IR) spectroscopy. Results include the effects of sample temperature in the range of 10 to 300 K and 4.636 μm laser pump power in the range of 28 mW to 1.43 W for the photoluminescence spectrum.

AFIT Designator

AFIT-GEO-ENP-06-03

DTIC Accession Number

ADA454283

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