Date of Award
Fall 2019
Document Type
Thesis
Degree Name
Master of Science in Applied Physics
Department
Department of Engineering Physics
First Advisor
Manuel Ferdinandus, PhD
Abstract
A sample metalens generated from Titanium Nitride deposited onto Aluminum Oxide was designed to focus at 10 microns with a beam centered at 800nm, and when analyzed with high intensity illumination was found to have a focal length of 9.650 ±.003µm at an intensity of 16.93[MW/cm2 ]. Analyzing this change by comparing it to a Fresnel Lens’ physics shows that for this lens, the effective nonlinear index of refraction is certainly greater than the nonlinear index of just Titanium Nitride itself, at −1.6239 × 10−15[m2/W] compared to the materials −1.3 × 10−15[m2/W]. Analyzing this lens by taking it a step further and comparing it to a Fresnel Phase Zone Plate give a nonlinear index of 1.653×10−11 , which deviates from the materials nonlinear index even further, by over 4 orders of magnitude. This shows that the microscopic petterning of TiN in the correct geometric manner increases its effective nonlinear index by at least 4 orders of magnitude, but likely more.
AFIT Designator
AFIT-ENP-MS-19-D-012
DTIC Accession Number
AD1089575
Recommended Citation
Cumming, Michael A., "Nonlinear Characterizing of a New Titanium Nitride on Aluminum Oxide Metalens" (2019). Theses and Dissertations. 3168.
https://scholar.afit.edu/etd/3168
Included in
Optics Commons, Plasma and Beam Physics Commons, Semiconductor and Optical Materials Commons
