Nonlinear Characterizing of a New Titanium Nitride on Aluminum Oxide Metalens

Author

Michael A. Cumming

Date of Award

Fall 2019

Document Type

Thesis

Degree Name

Master of Science in Applied Physics

Department

Department of Engineering Physics

First Advisor

Manuel Ferdinandus, PhD

Abstract

A sample metalens generated from Titanium Nitride deposited onto Aluminum Oxide was designed to focus at 10 microns with a beam centered at 800nm, and when analyzed with high intensity illumination was found to have a focal length of 9.650 ±.003µm at an intensity of 16.93[MW/cm² ]. Analyzing this change by comparing it to a Fresnel Lens’ physics shows that for this lens, the effective nonlinear index of refraction is certainly greater than the nonlinear index of just Titanium Nitride itself, at −1.6239 × 10⁻¹⁵[m²/W] compared to the materials −1.3 × 10⁻¹⁵[m²/W]. Analyzing this lens by taking it a step further and comparing it to a Fresnel Phase Zone Plate give a nonlinear index of 1.653×10⁻¹¹ , which deviates from the materials nonlinear index even further, by over 4 orders of magnitude. This shows that the microscopic petterning of TiN in the correct geometric manner increases its effective nonlinear index by at least 4 orders of magnitude, but likely more.

AFIT Designator

AFIT-ENP-MS-19-D-012

DTIC Accession Number

AD1089575

Recommended Citation

Cumming, Michael A., "Nonlinear Characterizing of a New Titanium Nitride on Aluminum Oxide Metalens" (2019). Theses and Dissertations. 3168.
https://scholar.afit.edu/etd/3168