Date of Award

11-2019

Document Type

Dissertation

Degree Name

Doctor of Philosophy (PhD)

Department

Department of Electrical and Computer Engineering

First Advisor

Tod V. Laurvick, PhD

Abstract

The phenomena known as secondary electron emission was discovered over a century ago. Yet it remains very difficult to model accurately due to the limited availability of reliable experimental data. With the growing use of computer simulations in hardware development, the need for accurate models has increased. This research focused on determining what factors may be causing measurement discrepancies and methods for increasing the accuracy of measurements. It was found that several assumptions are commonly invoked when these measurements are performed that may not always be consistent with reality. The violation of these assumptions leads to measurement bias that is contingent upon the apparatus and the voltages used during the measurement. This research showed that secondary electron yield measurements are sensitive to changes in the apparatus geometry, the current level, and the electron gun settings. New techniques, hardware, and models were developed in order facilitate greater measurement repeatability and accuracy.

AFIT Designator

AFIT-ENG-DS-19-D-007

DTIC Accession Number

AD1089572

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