Date of Award
3-22-2012
Document Type
Thesis
Degree Name
Master of Science
Department
Department of Engineering Physics
First Advisor
Michael A. Marciniak, PhD.
Abstract
The basic physics of nano-/micro-structured materials must be categorized through measurements and simulation to fully understand their scatter dependence on polarization and angle on incidence before they can be considered for war fighter applications. The off-normal incidence and polarization dependant scatter for a guided-mode resonance filter (GMRF) and a surface plasmonic polariton (SPP) extraordinary transmission filter is measured. The measurements are compared to finite-difference time domain (FDTD) simulations. The GMRF is found to exhibit extraordinary angular scatter at the resonant coupled modes. An approximation is developed to predict the dependence of these modes on wavelength, incident angle and polarization. For the SPP extraordinary filter, the lower-order SPP modes and their dependence on incident angle, polarization and grating momentum vector were identified. Full polarimetric spectral transmission was both measured and simulated, giving a Mueller matrix representation of the spectral transmission of the SPP filter. These results demonstrate the dependence on incident angle and polarization of the extraordinary characteristics of two classes of nano-/micro-structured materials.
AFIT Designator
AFIT-EE.ABET-ENP-12-M02
DTIC Accession Number
ADA557538
Recommended Citation
Sellers, Spencer R., "FDTD Simulation of Novel Polarimetric and Directional Refelectance and Transmittance Measurements from Optical Nano- and Micro-Structured Materials" (2012). Theses and Dissertations. 1189.
https://scholar.afit.edu/etd/1189