Document Type
Article
Publication Date
5-1-2017
Abstract
We develop a series of analytical approximations allowing for rapid extraction of the nonlinear parameters from beam deflection measurements. We then apply these approximations to the analysis of cadmium silicon phosphide and compare the results against previously published parameter extraction methods and find good agreement for typical experimental conditions.
Source Publication
Optical Materials Express
Recommended Citation
Manuel R. Ferdinandus, Jennifer M. Reed, Kent L. Averett, F. Kenneth Hopkins, and Augustine Urbas, "Analysis of beam deflection measurements in the presence of linear absorption," Opt. Mater. Express 7, 1598-1605 (2017). https://doi.org/10.1364/OME.7.001598
Comments
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