Measuring the Reflection Matrix of a Rough Surface

Authors

Kenneth W. Burgi, Air Force Institute of TechnologyFollow
Michael A. Marciniak, Air Force Institute of TechnologyFollow
Mark E. Oxley, Air Force Institute of TechnologyFollow
Stephen E. Nauyoks, Air Force Institute of Technology

Document Type

Article

Publication Date

5-31-2017

Abstract

Phase modulation methods for imaging around corners with reflectively scattered light required illumination of the occluded scene with a light source either in the scene or with direct line of sight to the scene. The RM (reflection matrix) allows control and refocusing of light after reflection, which could provide a means of illuminating an occluded scene without access or line of sight. Two optical arrangements, one focal-plane, the other an imaging system, were used to measure the RM of five different rough-surface reflectors. Intensity enhancement values of up to 24 were achieved. Surface roughness, correlation length, and slope were examined for their effect on enhancement. Diffraction-based simulations were used to corroborate experimental results.

Comments

This is an open access article published by MDPI and distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. CC BY 4.0

Sourced from the published version of record cited below.

DOI

10.3390/app7060568

Source Publication

Applied Sciences

Recommended Citation

Burgi, K. W., Marciniak, M. A., Oxley, M. E., & Nauyoks, S. E. (2017). Measuring the reflection matrix of a rough surface. Applied Sciences, 7(6), 568. https://doi.org/10.3390/app7060568