Date of Award

3-21-2013

Document Type

Thesis

Degree Name

Master of Science

Department

Department of Engineering Physics

First Advisor

Kevin C. Gross, PhD.

Abstract

A Bomem 200 series Fourier transform infrared spectrometer and FLIR Systems Inc InGaAs infrared (IR) camera was used to measure the degree of linear polarization (DOLP) from a metal and glass surfaces. This was accomplished by placing a wire grid polarizer in front of the aperture of the FTIR and IR camera to measure the polarized reflection from the target material. For the IR camera, an average of pixel counts was collected over the area of the target to measure to DOLP. Factors impacting the accuracy of the measurements from the FTIR are calibration, instrument self emission, and alignment error. Factors impacting the value of the DOLP from the material are the complex index of refraction, angle of incidence, and surface roughness. Results of these measurements match theory with varying success and also show the limitation and challenges associated with the physical limitation of the equipment used.

AFIT Designator

AFIT-ENP-13-M-05

DTIC Accession Number

ADA582622

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