Date of Award
12-2021
Document Type
Thesis
Degree Name
Master of Science in Optical Science and Engineering
Department
Department of Engineering Physics
First Advisor
Michael A. Marciniak, PhD
Abstract
An optical scatterometer is used to characterize the infrared scatter of a dielectric metasurface cylindrical lens and two variants of that design. The design uses dielectric nanopillars to create the parabolic phase delay required for lensing; the variants change the length of the nanopillars from the design length of 4 microns to 0.9 and 5.2 microns. Scatter measurements were made at the design wavelength of 4 microns, and at 3.39 and 5 microns. These measurements showed wide-angle scatter greater than that measured for a conventional refractive optic, and that these metasurfaces perform their optical function best at the design wavelength and nanopillar length, or at the longer nanopillar length.
AFIT Designator
AFIT-ENP-MS-21-D-021
DTIC Accession Number
AD1157174
Recommended Citation
Miller, Matthew R., "Characterization of Infrared Metasurface Optics with an Optical Scatterometer" (2021). Theses and Dissertations. 5105.
https://scholar.afit.edu/etd/5105