Date of Award


Document Type


Degree Name

Master of Science


Department of Engineering Physics

First Advisor

James C. Petrosky, PhD


The purpose of this research was to search for evidence of low temperature annealing from neutron irradiated 4H-silicon carbide. No features suggesting annealing were found below a temperature of 340K. Temperature dependant Hall effect measurements were taken over a range of 100K to 340K recording resistivity, carrier densities, and mobility. Resistivity was noted to increase with irradiations, and carrier densities appeared to decrease, while mobility appeared minimally affected by neutron irradiation. This suggests the creation of active acceptor defects decreasing carrier concentrations. N-type samples measured were 5mm x 5mm square with Nickel contacts, and irradiated to 1010 and 1016 n-cm/cm3 of 1MeV equivalent neutron fluence. Suggestions for continuing research include using a probe station instead of wire connections to samples, use a large source current to minimize variance, and minimize cadmium shielding to reduce negative reactivity.

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DTIC Accession Number