Date of Award
Master of Science
Department of Electrical and Computer Engineering
Michael J. Havrilla, PhD
A new, low-frequency, rectangular waveguide-based electromagnetic material characterization technique is developed that will reduce the test sample size in two dimensions realizing up to 75 percent reduction in sample cross-sectional area. To achieve this, custom made, reduced aperture, sample holder flanges were used that reduce the waveguide’s excessive cross-sectional dimensions, resulting in reduced sample fabrication costs. Additionally, MatLab® code was developed to implement the rigorously derived modal-analysis solution that accommodates induced, higher-order transverse electric and transverse magnetic modes and accurately extract the reduced test sample’s constitutive parameters. Experimental results using various test samples are compared to known, full-aperture measurements for both the reduced aperture waveguide configurations to verify the theoretical analysis. A differential error analysis is also performed for each configuration in an attempt to estimate the error associated with test sample thickness, aperture dimensions, and sample placement uncertainties.
Dwyer, Derek R., "Efficient Electromagnetic material Characterization Via 2-D Rectangular Waveguide Reduction" (2005). Theses and Dissertations. 3861.