Date of Award

3-26-2006

Document Type

Thesis

Degree Name

Master of Science in Operations Research

Department

Department of Operational Sciences

First Advisor

David R. Denhard, PhD

Abstract

The study of a system's reliability has played a crucial role in business and industry since the dawn of modern technology. Current graphical models utilized in reliability theory are limited in that no one model or technique allows for a thorough analysis of system reliability. This research introduces a new graphical model and methodology to be used in the field of reliability that addresses this concern. Event Occurrence Networks (EONs) and their solution methodologies provide an all-inclusive graphical model that allows for the manipulation of several important reliability measures. An EON is a probabilistic network that represents the superposition of several terminating counting processes and is an efficient tool in both non-repairable and repairable systems. Current methodologies are also restricted in the distributions that characterize component life and repair times. This concern is alleviated via EONs coupled with piecewise polynomial approximation.

AFIT Designator

AFIT-GOR-ENS-06-17

DTIC Accession Number

ADA445182

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