Date of Award
Master of Science in Electrical Engineering
Department of Electrical and Computer Engineering
Samuel Stone, PhD.
The research presented here provides a comparison of classification, verification, and computational time for three techniques used to analyze Unintentional Radio- Frequency (RF) Emissions (URE) from semiconductor devices for the purposes of device discrimination and operation identification. URE from ten MSP430F5529 16-bit microcontrollers were analyzed using: 1) RF Distinct Native Attribute (RFDNA) fingerprints paired with Multiple Discriminant Analysis/Maximum Likelihood (MDA/ML) classification, 2) RF-DNA fingerprints paired with Generalized Relevance Learning Vector Quantized-Improved (GRLVQI) classification, and 3) Time Domain (TD) signals paired with matched filtering. These techniques were considered for potential applications to detect counterfeit/Trojan hardware infiltrating supply chains and to defend against cyber attacks by monitoring executed operations of embedded systems in critical Supervisory Control And Data Acquisition (SCADA) networks.
DTIC Accession Number
Stone, Barron D., "Comparison of Radio Frequency Distinct Native Attribute and Matched Filtering Techniques for Device Discrimination and Operation Identification" (2016). Theses and Dissertations. 323.