Date of Award

3-24-2016

Document Type

Thesis

Degree Name

Master of Science in Electrical Engineering

Department

Department of Electrical and Computer Engineering

First Advisor

Samuel Stone, PhD.

Abstract

The research presented here provides a comparison of classification, verification, and computational time for three techniques used to analyze Unintentional Radio- Frequency (RF) Emissions (URE) from semiconductor devices for the purposes of device discrimination and operation identification. URE from ten MSP430F5529 16-bit microcontrollers were analyzed using: 1) RF Distinct Native Attribute (RFDNA) fingerprints paired with Multiple Discriminant Analysis/Maximum Likelihood (MDA/ML) classification, 2) RF-DNA fingerprints paired with Generalized Relevance Learning Vector Quantized-Improved (GRLVQI) classification, and 3) Time Domain (TD) signals paired with matched filtering. These techniques were considered for potential applications to detect counterfeit/Trojan hardware infiltrating supply chains and to defend against cyber attacks by monitoring executed operations of embedded systems in critical Supervisory Control And Data Acquisition (SCADA) networks.

AFIT Designator

AFIT-ENG-MS-16-M-048

DTIC Accession Number

Pending

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