Date of Award


Document Type


Degree Name

Master of Science


Department of Electrical and Computer Engineering

First Advisor

Todd R. Andel, PhD.


In recent years, thermal sensing in digital devices has become increasingly important. From a security perspective, new thermal-based attacks have revealed vulnerabilities in digital devices. Traditional temperature sensors using analog-to-digital converters consume significant power and are not conducive to rapid development. As a result, there has been an escalating demand for low cost, low power digital temperature sensors that can be seamlessly integrated onto digital devices. This research seeks to create a modular Field Programmable Gate Array digital temperature sensor with auto one-point calibration to eliminate the excessive costs and time associated with calibrating existing digital temperature sensors. In addition, to support the auxiliary protection role, the sensor is evaluated alongside a RSA circuit implemented on the same chip, with methods developed to mitigate noise and power fluctuations introduced by the main circuit. The result is a digital temperature sensor resistant to noise and suitable for quick mass deployment in digital devices.

AFIT Designator