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Broadband Characterization of Materials Using a Dual-Ridged Waveguide, Milo W. Hyde IV, Michael J. Havrilla, Andrew E. Bogle, Nathan J. Lehman Faculty Publications
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A Clamped Dual-Ridged Waveguide Measurement System for the Broadband, Nondestructive Characterization of Sheet Materials, Milo W. Hyde IV, Michael J. Havrilla Faculty Publications
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