Use of a Novel Infrared Wavelength-tunable Laser Mueller-matrix Polarimetric Scatterometer to Measure Nanostructured Optical Materials, Jason C. Vap, Stephen E. Nauyoks, Michael R. Benson, Michael A. Marciniak
Faculty Publications

Measuring the Reflection Matrix of a Rough Surface, Kenneth W. Burgi, Michael A. Marciniak, Mark E. Oxley, Stephen E. Nauyoks
Faculty Publications