Benefits of Considering More Than Temperature Acceleration for GaN HEMT Life Testing, Ronald A. Coutu Jr., Robert A. Lake, Bradley D. Christiansen, Eric R. Heller, Christopher A. Bozada, Brian S. Poling, Glen D. Via, James P. Theimer, Stephen E. Tetlak, Ramakrishna Vetury, Jeffrey B. Shealy
Faculty Publications

A Very Robust AlGaN/GaN HEMT Technology to High Forward Gate Bias and Current, Bradley D. Christiansen, Eric R. Heller, Ronald A. Coutu Jr., Ramakrishna Vetury, Jeffrey B. Shealy
Faculty Publications

Investigation of Gallium Nitride Transistor Reliability through Accelerated Life Testing and Modeling, Bradley D. Christiansen
Theses and Dissertations

Active FPGA Security through Decoy Circuits, Bradley D. Christiansen
Theses and Dissertations