Use of a Novel Infrared Wavelength-tunable Laser Mueller-matrix Polarimetric Scatterometer to Measure Nanostructured Optical Materials, Jason C. Vap, Stephen E. Nauyoks, Michael R. Benson, Michael A. Marciniak
Faculty Publications

Optical Characterization of Silver Nanorod Thin Films Grown Using Oblique Angle Deposition, Michael R. Benson, Piyush Shah, Michael A. Marciniak, Andrew Sarangan, Augustine Urbas
Faculty Publications

Design Considerations Regarding Ellipsoidal Mirror Based Reflectometers, Michael R. Benson, Michael A. Marciniak
Faculty Publications